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Proceedings Paper

Rapid nondestructive evaluation of defects in GFRP composites using terahertz line scanner
Author(s): A. Mercy Latha; Supriyanka Rayapureddy; Nirmala Devi; Prabhu Rajagopal; Krishnan Balasubramaniam; Bala Pesala
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Paper Abstract

Terahertz (THz) imaging is an attractive alternate to ultrasonic based Non-destructive Evaluation (NDE) especially for Fiber Reinforced Polymers (FRPs) such as Glass FRP (GFRP) composites as the latter demands proximity and additional coupling medium for the best performance. Typically, THz imaging system uses a single emitter-detector configuration employing raster scan method for image acquisition. The image acquisition speed is greatly limited by the speed of the mechanical stages and hence its usage in real-time industrial NDT applications such as in-line quality control has been limited. Alternatively, having an array of detectors will significantly increase the system cost. As an optimal compromise for speed and cost, line scanners are highly desirable. In this work, rapid imaging performance of a THz line scanner has been studied by imaging closely spaced defects in GFRP composites using a 100 GHz source. The total acquisition time for imaging the GFRP sample of dimensions 55× 35 mm2 is 10 s, which is >100 times faster compared to a conventional raster scanning technique. In addition, image deconvolution techniques such as Lucy Richardson and Weiner deconvolution have been adopted to improve the quality of the acquired THz images. The results show that the THz line scanners can successfully be employed for rapid defect detection in GFRP composites.

Paper Details

Date Published: 2 March 2020
PDF: 7 pages
Proc. SPIE 11279, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XIII, 1127917 (2 March 2020); doi: 10.1117/12.2545922
Show Author Affiliations
A. Mercy Latha, Central Electronics Engineering Research Institute (India)
Supriyanka Rayapureddy, Indian Institute of Technology Madras (India)
Nirmala Devi, Central Electronics Engineering Research Institute (India)
Academy of Scientific and Innovative Research (India)
Prabhu Rajagopal, Indian Institute of Technology Madras (India)
Krishnan Balasubramaniam, Indian Institute of Technology Madras (India)
Bala Pesala, Central Electronics Engineering Research Institute (India)
Academy of Scientific and Innovative Research (India)


Published in SPIE Proceedings Vol. 11279:
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XIII
Laurence P. Sadwick; Tianxin Yang, Editor(s)

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