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Proceedings Paper

Evaluation of a combined two-color phase plate forming three-dimensional dark holes in super resolution microscopy
Author(s): Koumei Nagai; Takashi Maruyama; Akira Kodaira; Hiroshi Kumagai; Nándor Bokor; Yoshinori Iketaki
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Paper Abstract

In this study, a combined two-color phase plate (CTPP) was designed for super-resolution microscopy based on upconversion fluorescence depletion (FD), fabricated, and evaluated. It is composed of two types of phase plates, a spiral phase plate and an annular phase plate. A two-color phase plate modulates the phase of the erase beam while maintaining the phase of the pump beam. SRM performed using the proposed CTPP is expected to enable super resolution in both the focal plane and in the optical axis direction. Despite its complex structure, a highly accurate CTPP was obtained by using the exposure and etching processes used in semiconductor manufacturing.

Paper Details

Date Published: 17 February 2020
PDF: 5 pages
Proc. SPIE 11245, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVII, 1124518 (17 February 2020); doi: 10.1117/12.2545877
Show Author Affiliations
Koumei Nagai, NTT Advanced Technology Corp. (Japan)
Takashi Maruyama, NTT Advanced Technology Corp. (Japan)
Akira Kodaira, NTT Advanced Technology Corp. (Japan)
Hiroshi Kumagai, Kitasato Univ. (Japan)
Nándor Bokor, Budapest Univ. of Technology and Economics (Hungary)
Yoshinori Iketaki, Kitasato Univ. (Japan)
Olympus Corp. (Japan)

Published in SPIE Proceedings Vol. 11245:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVII
Thomas G. Brown; Tony Wilson; Laura Waller, Editor(s)

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