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Proceedings Paper

Imaging 3D orientation and wobbling of single fluorescent emitters by polarized super-resolved microscopy (Conference Presentation)

Paper Abstract

Measuring 3D orientation properties of single fluorescent emitters including their angle wobbling, as well as their position, is a challenge that would enrich super-resolution techniques with structural molecular information. We present a polarized microscopy technique that provides all 3D orientation parameters unambiguously, using four-polarization splitting of the image plane and intensity filtering in the back focal plane. Using an inverse problem approach we can retrieve 3D orientation, wobbling and 2D position of the fluorophores with high precision. We validated the technique using fluorescent nano-beads and applied it to the structural study of fluorescently labelled F-actin filaments.

Paper Details

Date Published: 9 March 2020
Proc. SPIE 11246, Single Molecule Spectroscopy and Superresolution Imaging XIII, 112460V (9 March 2020); doi: 10.1117/12.2545668
Show Author Affiliations
Valentina Curcio, Institut Fresnel (France)
Caio Vaz Rimoli, Institut Fresnel (France)
Cesar Augusto Valades Cruz, Institut Curie (France)
Pascal Verdier-Pinard, Ctr. de Recherche en Cancérologie de Marseille (France)
Manos Mavrakis, Institut Fresnel (France)
Sophie Brasselet, Institut Fresnel (France)

Published in SPIE Proceedings Vol. 11246:
Single Molecule Spectroscopy and Superresolution Imaging XIII
Ingo Gregor; Felix Koberling; Rainer Erdmann, Editor(s)

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