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Proceedings Paper

Noise control in dual-frequency VECSELs for Cs CPT Clocks (Conference Presentation)
Author(s): Fabien Bretenaker; Gregory Gredat; Hui Liu; Fabienne Goldfarb; Ghaya Baili; François Gutty; Isabelle Sagnes; Jeremy Cotxet; François Tricot

Paper Abstract

Atomic clocks based on Coherent Population Trapping (CPT) in cesium [1] or other sensors based on CPT require the development of specific low noise laser sources at resonant wavelengths. For instance, the double lambda scheme for CPT probed by lin ⊥ lin laser beams, which has been shown to create Raman–Ramsey fringes with a larger contrast than the usual simple lambda scheme in [2], requires the availability of two cross-linearly polarized frequencies at 852 nm with a low beat note phase noise and a low intensity noise. One way to generate these two frequencies with low amplitude and phase noises is to build a dual-frequency VECSEL (Vertical External Cavity Surface Emitting Laser) [3]. In this talk we will present our efforts to understand the physical origin of the laser amplitude and phase noises [4], and the developments that we have made to reduce these noises to the levels necessary to achieve a relative clock stability of 10-13 at 1 s integration time.

Paper Details

Date Published: 9 March 2020
Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 112960A (9 March 2020); doi: 10.1117/12.2545583
Show Author Affiliations
Fabien Bretenaker, Lab. Aimé Cotton (France)
Raman Research Institute (India)
Gregory Gredat, Lab. Aimé Cotton (France)
Hui Liu, Lab. Aimé Cotton (France)
Fabienne Goldfarb, Lab. Aimé Cotton (France)
Ghaya Baili, Thales Research & Technology (France)
François Gutty, Thales Research & Technology (France)
Isabelle Sagnes, Ctr. de Nanosciences et de Nanotechnologies (France)
Jeremy Cotxet, Thales Research & Technology (France)
François Tricot, Thales Research & Technology (France)

Published in SPIE Proceedings Vol. 11296:
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
Selim M. Shahriar; Jacob Scheuer, Editor(s)

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