Share Email Print
cover

Proceedings Paper

Augmented reality, 3D measurement, and thermal imagery for computer-assisted manufacturing
Author(s): Jonathan Boisvert; Marc-Antoine Drouin; Guy Godin; Michel Picard
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

One of the challenges in high-precision manufacturing is constant inspection as well as efficient communication of the inspection results to the workers. In this context, we are presenting a multi-modal 3D imaging system designed for computer-assisted assembly manufacturing using augmented reality. The three-dimensional measurement subsystem is a structured-light system based on a digital micro-mirror device (DMD). The augmented reality imagery is displayed on the components being manufactured using another DMD-based color projector that uses wavelengths that do not interfere with the 3D measurements. A thermal camera is also part of the system and calibrated with respect to the measurement and projection subsystems. In typical target usage, the system can display localized shape deviation with respect to nominal values, or the surface temperature across the component, or any information obtained or derived from the subsystems. Moreover, it can be used to display assembly instructions and validate the compliance of the final manufactured component.

Paper Details

Date Published: 28 February 2020
PDF: 8 pages
Proc. SPIE 11294, Emerging Digital Micromirror Device Based Systems and Applications XII, 112940L (28 February 2020); doi: 10.1117/12.2545382
Show Author Affiliations
Jonathan Boisvert, National Research Council Canada (Canada)
Marc-Antoine Drouin, National Research Council Canada (Canada)
Guy Godin, National Research Council Canada (Canada)
Michel Picard, National Research Council Canada (Canada)


Published in SPIE Proceedings Vol. 11294:
Emerging Digital Micromirror Device Based Systems and Applications XII
John Ehmke; Benjamin L. Lee, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray