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Three-dimensional tomographic imaging and quantitative phase measurement using virtual phase conjugation
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Paper Abstract

We have proposed virtual-phase-conjugation-based optical tomography (VPC-OT) using a virtual phase conjugation technology for single-shot and three-dimensional optical tomography. In VPC-OT, a random-spatial-phase-modulated probe beam is irradiated to the sample to be measured, and the complex amplitude of the signal composed of a superimposition of light reflected from each layer of the sample is measured. A three-dimensional tomogram of intensity and phase is obtained by reproducing the measured complex amplitude using a phase conjugate wave in a virtual optical system built in a computer. At this time, by changing the parameters of the virtual optical system, it becomes possible to obtain information of various tomographic planes from the data obtained with a single measurement. In the ideal virtual phase conjugate reproduction process, free space propagation can be assumed; however, in the actual measurement, due to the distortion of the waves and the surroundings of the sample to be measured, a mismatch will occur in modulation and demodulation, and the separation accuracy between different tomographic planes would be degraded. We perform an experiment to clarify the characteristics of VPC-OT in this situation. In this experiment, three-dimensional optical tomography is performed using an etching glass having a periodic structure of 30 μm as a sample, and the phase distribution is measured quantitatively. Furthermore, by placing a cover glass in front of the object and performing the same measurement, we discuss the characteristics and performance of VPC-OT when there is an optical distortion around the sample to be measured.

Paper Details

Date Published: 17 February 2020
PDF: 6 pages
Proc. SPIE 11245, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVII, 1124510 (17 February 2020); doi: 10.1117/12.2545353
Show Author Affiliations
Satoshi Kawashima, Hokkaido Univ. (Japan)
Atsushi Okamoto, Hokkaido Univ. (Japan)
Tomohiro Maeda, Hokkaido Univ. (Japan)
Kazuhisa Ogawa, Hokkaido Univ. (Japan)
Akihisa Tomita, Hokkaido Univ. (Japan)
Ryusuke Osaki, FUJIFILM Corp. (Japan)
Naoki Hayashi, FUJIFILM Corp. (Japan)

Published in SPIE Proceedings Vol. 11245:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVII
Thomas G. Brown; Tony Wilson; Laura Waller, Editor(s)

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