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Proceedings Paper

Adaptive atomic force microscope
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Paper Abstract

Commercial atomic force microscope (AFM) solutions do not typically lend themselves to easy integration into a wide range of optical microscope platforms. Here we present a custom AFM platform which is readily integrated into an FPGA controlled fluorescence microscope and is easily programmed for a variety of unique applications. Our collimated laser design allows for an adjustable sensitivity depending on the range of forces required, and the large range piezo (100μm in all three dimensions) presents the freedom to perform precise measurement and manipulation in a high throughput manner, over a broad range of distances. We demonstrate a high bandwidth of 1MHz with low noise levels of less than 71pN at full bandwidth and below 6pN at a relevant bandwidth of 1kHz.

Paper Details

Date Published: 13 February 2020
PDF: 7 pages
Proc. SPIE 11246, Single Molecule Spectroscopy and Superresolution Imaging XIII, 1124604 (13 February 2020); doi: 10.1117/12.2545261
Show Author Affiliations
Patrick D. Schmidt, Univ. of California, Davis (United States)
Iowa State Univ. (United States)
Benjamin H. Reichert, Iowa State Univ. (United States)
John G. Lajoie, Iowa State Univ. (United States)
Sanjeevi Sivasankar, Univ. of California, Davis (United States)

Published in SPIE Proceedings Vol. 11246:
Single Molecule Spectroscopy and Superresolution Imaging XIII
Ingo Gregor; Felix Koberling; Rainer Erdmann, Editor(s)

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