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Proceedings Paper

Research on starlight level broad spectrum full color imaging technology
Author(s): Jin-bao Yang Sr.; Yi Lu; Li Wang; Kang Zhao M.D.; Chen Yang; Ya-chao Liu; Xiao-hua Chai
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Paper Abstract

Research of starlight-level wide-spectrum full-color imaging technology is aimed at the current demand of obtaining the real color image in the low ambient light. because traditional visible light imaging, laser imaging, thermal imaging and other technical methods can only obtain the target grayscale imaging information, but not obtain the target true color information. According to statistics, color images contain 30 times more information than grayscale images, and spectral information is extremely critical in target recognition. This paper intends to adopt an imaging method that integrates super large pixels, ultra-thin process microlens collection, and large-diameter light transmission to increase the sensitivity of the device by 50~100 times. The technical difficulty at this stage is based on large pixel, large area array, high pass light rate, low noise imaging device preparation technology. The key to achieving full-color imaging is the fabrication of large-pixel, large-area imaging devices and high-transmission, low-noise process technology. On this basis, we also designed deep learning image processing algorithms, conducted color brightening and enhancement of devices’ physical true color, and increased the signal-to-background ratio of images, which laid a technological foundation for the follow-up target detection and identification, and industrialized application. lastly, the minimum illumination of color night vision is 0.0001Lux@25Hz, F1.0, thereby achieving wide-spectrum full-color imaging.

Paper Details

Date Published: 18 December 2019
PDF: 13 pages
Proc. SPIE 11338, AOPC 2019: Optical Sensing and Imaging Technology, 113381V (18 December 2019); doi: 10.1117/12.2544924
Show Author Affiliations
Jin-bao Yang Sr., China Aerospace Science & Industry Corp., Ltd. (China)
Yi Lu, China Aerospace Science & Industry Corp., Ltd. (China)
Li Wang, China Aerospace Science & Industry Corp., Ltd. (China)
Kang Zhao M.D., China Aerospace Science & Industry Corp., Ltd. (China)
Chen Yang, China Aerospace Science & Industry Corp., Ltd. (China)
Ya-chao Liu, China Aerospace Science & Industry Corp., Ltd. (China)
Xiao-hua Chai, China Aerospace Science & Industry Corp., Ltd. (China)


Published in SPIE Proceedings Vol. 11338:
AOPC 2019: Optical Sensing and Imaging Technology
John E. Greivenkamp; Jun Tanida; Yadong Jiang; HaiMei Gong; Jin Lu; Dong Liu, Editor(s)

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