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Proceedings Paper

Layer-dependent third-harmonic generation in multi-layer SnSe2
Author(s): Rabindra Biswas; Medha Dandu; Keshav Kumar Jha; Sruti Menon; Jyothsna K. M.; Kaushik Majumdar; Varun Raghunathan
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Paper Abstract

We report spatially resolved measurement of third-harmonic generation (THG) emission from a Tin diselenide (SnSe2) multi-layer flake at a fundamental excitation wavelength of 1550 nm using a nonlinear optical microscopy system and study its thickness dependence. We also estimate the magnitude of the real part of the electronic nonlinearity susceptibility (χ(3) coefficient) by analyzing the thickness-dependence and found to be approximately 1.6×10-19 m2/V2, which is around 1500 times higher than that of the glass when measured with the same settings. We find excellent agreement between the measured THG thickness dependence and the analytical model considering absorption of harmonic emission in SnSe2 medium, phase mismatch and the multipath interference due to the underlying oxide/Si substrate. We also measure the second harmonic generation from same flake and find this to be maximum for thickness in the range of 10-12nm.

Paper Details

Date Published: 18 February 2020
PDF: 7 pages
Proc. SPIE 11282, 2D Photonic Materials and Devices III, 112820R (18 February 2020); doi: 10.1117/12.2544799
Show Author Affiliations
Rabindra Biswas, Indian Institute of Science, Bangalore (India)
Medha Dandu, Indian Institute of Science, Bangalore (India)
Keshav Kumar Jha, Indian Institute of Science, Bangalore (India)
Sruti Menon, Indian Institute of Science, Bangalore (India)
Jyothsna K. M., Indian Institute of Science, Bangalore (India)
Kaushik Majumdar, Indian Institute of Science, Bangalore (India)
Varun Raghunathan, Indian Institute of Science, Bangalore (India)


Published in SPIE Proceedings Vol. 11282:
2D Photonic Materials and Devices III
Arka Majumdar; Carlos M. Torres Jr.; Hui Deng, Editor(s)

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