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Proceedings Paper

High-resolution single-shot refractive index variation measurement using quadriwave lateral shearing interferometry (Conference Presentation)
Author(s): Antoine Federici; Sherazade Aknoun; William Boucher; Benoit Wattellier

Paper Abstract

Quadriwave lateral shearing interferometry (QWLSI) is a wave front sensing technology based on the analysis of an interferogram created by waves diffracted by an optical grating set in front of a camera sensor. Since QWLSI is a single-arm interferometry modality is has the advantage of being very compact, robust and easy to implement. It enables to achieve a phase resolution of 5nm. In this paper, we will describe the QWLSI system and apply it to metasurface shape and laser-induced refractive index variation measurements like waveguides and LIDT.

Paper Details

Date Published: 10 March 2020
Proc. SPIE 11290, High Contrast Metastructures IX, 112901J (10 March 2020); doi: 10.1117/12.2544303
Show Author Affiliations
Antoine Federici, PHASICS S.A. (France)
Sherazade Aknoun, PHASICS S.A. (France)
William Boucher, PHASICS S.A. (France)
Benoit Wattellier, PHASICS S.A. (France)

Published in SPIE Proceedings Vol. 11290:
High Contrast Metastructures IX
Connie J. Chang-Hasnain; Andrei Faraon; Weimin Zhou, Editor(s)

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