Share Email Print
cover

Proceedings Paper

Study on the glassy and conductive properties of SiO2-B2O3-P2O5-Al2O3-MxOy system
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The resistive plate chamber (RPC) is a gaseous parallel-plate detector, the glass resistive plate is the key element of RPC. In order to meet the requirement of high flux particle detection, it is urgent to develop low resistivity electroconductive glass. For this purpose, we designed the glass of SiO2-B2O3-P2O5-Al2O3-MxOysystem, the MxOy was chosen as Fe2O3, V2O5 and MnO2. In this paper, the formation abilities and conductive properties of glass were studied by adjusting the contents of the glass forming body and MxOy. The results showed that P2O5-Al2O3and P2O5-B2O3 built a quasi-[SiO4] tetrahedron structure as the glass forming body, the SiO2strengthened the network, which greatly improved the stability of the glass. Meanwhile, the addition of B2O3 and P2O5 could enhance the doping ability of MxOy in the whole glass system, which was benefit to reduce the resistivity of glass. Three transition metal oxides were added to the same base glass, and their resistivity was in order: ρFeρVρMn. The relationships between the oxidation-reduction atmosphere of glass melting and the resistivity of glass were investigated. The conductivity types was confirmed to be electronic conductive by testing the Seebeck coefficient and Hall effect of glass. The resistivity of the developed SiO2- B2O3-P2O5-Al2O3-Fe2O3 electronic conductive glass system was reached to1010Ω·cmlevel.

Paper Details

Date Published: 18 December 2019
PDF: 6 pages
Proc. SPIE 11334, AOPC 2019: Optoelectronic Devices and Integration; and Terahertz Technology and Applications, 113340U (18 December 2019); doi: 10.1117/12.2544280
Show Author Affiliations
Hui Liu, Key Lab. of Special Optoelectronic Materials of China Building Materials Industry (China)
China Building Materials Academy (China)
Tiezhu Bo, China Building Materials Academy (China)
Yong Sun, China Building Materials Academy (China)
Xian Zhang, China Building Materials Academy (China)
Lei Zhang, China Building Materials Academy (China)
Hua Cai, Key Lab. of Special Optoelectronic Materials of China Building Materials Industry (China)
China Building Materials Academy (China)
Jiao Lian, Key Lab. of Special Optoelectronic Materials of China Building Materials Industry (China)
China Building Materials Academy (China)
Dongzhan Zhou, Key Lab. of Special Optoelectronic Materials of China Building Materials Industry (China)
China Building Materials Academy (China)
Yu Shi, China Building Materials Academy (China)
You Zhou, China Building Materials Academy (China)
Chang Liu, Key Lab. of Special Optoelectronic Materials of China Building Materials Industry (China)
China Building Materials Academy (China)
Chen Wang, Key Lab. of Special Optoelectronic Materials of China Building Materials Industry (China)
China Building Materials Academy (China)
Qing Li, Key Lab. of Special Optoelectronic Materials of China Building Materials Industry (China)
China Building Materials Academy (China)
Jiawen Zhang, Institute of High Energy Physics (China)
State Key Lab. of Particle Detection and Electronics (China)
Shulin Liu, Institute of High Energy Physics (China)
State Key Lab. of Particle Detection and Electronics (China)
Baojun Yan, Institute of High Energy Physics (China)
State Key Lab. of Particle Detection and Electronics (China)


Published in SPIE Proceedings Vol. 11334:
AOPC 2019: Optoelectronic Devices and Integration; and Terahertz Technology and Applications
Zhiping Zhou; Xiao-Cong Yuan; Daoxin Dai, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray