Share Email Print
cover

Proceedings Paper

A fault injection system for space imaging application
Author(s): Jinqiao Wang; Yongqiang Duan; Tengfei Ma
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The SRAM-based FPGAs are widely used in space imaging system because of their reprogramming advantages. However, designers must be concerned with the effect of single event upset(SEU) on FPGA configuration memory in the space application. To evaluate the performance of SRAM-based FPGA against SEU, simulating SEU fault injection test is a common method. This paper mainly studies the method of fault injection test and the structure of test platform. The data of CCD driving timing is flipped bit by bit on the test platform. And finally count the fault rate is 1.25%, then taking about 240ms to repair the fault.

Paper Details

Date Published: 18 December 2019
PDF: 6 pages
Proc. SPIE 11335, AOPC 2019: Display Technology and Optical Storage, 1133509 (18 December 2019); doi: 10.1117/12.2544241
Show Author Affiliations
Jinqiao Wang, Xi'an Institute of Optics and Precision Mechanics (China)
Univ. of Chinese Academy of Science (China)
Yongqiang Duan, Xi'an Institute of Optics and Precision Mechanics (China)
Tengfei Ma, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 11335:
AOPC 2019: Display Technology and Optical Storage
Byoungho Lee; Yongtian Wang; Xiaodi Tan, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray