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Proceedings Paper

Digital holography for evaluation of the refractive index distribution externally induced in semiconductors
Author(s): Vira R. Besaga; Nils C. Gerhardt; Martin R. Hofmann
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Paper Abstract

In this paper, we analyse the capabilities of the digital holographic approach for evaluation of the refractive index distribution appearing in semiconductor materials due to external optical excitation. The study is based on a modified transmission Mach-Zehnder holographic microscope operating in the near-infrared spectral range. Practical considerations for holographic characterization of semiconductor samples are discussed. Experimentally measured data are compared with simulations as well as approaches to interpretation of the retrieved data are covered.

Paper Details

Date Published: 21 February 2020
PDF: 7 pages
Proc. SPIE 11306, Practical Holography XXXIV: Displays, Materials, and Applications, 1130608 (21 February 2020); doi: 10.1117/12.2544160
Show Author Affiliations
Vira R. Besaga, Ruhr Univ. Bochum (Germany)
Nils C. Gerhardt, Ruhr Univ. Bochum (Germany)
Martin R. Hofmann, Ruhr Univ. Bochum (Germany)


Published in SPIE Proceedings Vol. 11306:
Practical Holography XXXIV: Displays, Materials, and Applications
Hans I. Bjelkhagen, Editor(s)

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