
Proceedings Paper
Wide field of view and high resolution infrared polarimetric surveillance systemFormat | Member Price | Non-Member Price |
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Paper Abstract
In order to improve the detection capability of foreign objects debris (FOD) on airport runway. A wide area, high resolution infrared polarimetric surveillance system has been designed. Infrared polarimetric imaging can increase the dimension of the detection information ,then improve the detail features and contrast of the FOD image, the range of surveillanc is expanded by optical multiplexing while the image resolution remains unchanged. The focal length of the optical system is 80mm, the F number is 2, the pixel resolution is 1.29′,the frame rate is 10Hz, the MTF is higher than 0.8 at the 17lp/mm. The experimental results of the FOD detection indicate that the field of view of this system has reached 20.62°×5.5°, the horizontal field of view was nearly 3 times than the optical system with the same focal length, comparing with the intensity image,the contrast of target and background is enhanced by 41.6 to 207.9 times, the local signal-to-clutter ratio is enhanced by 1.1 to 2.2 times.
Paper Details
Date Published: 18 December 2019
PDF: 12 pages
Proc. SPIE 11338, AOPC 2019: Optical Sensing and Imaging Technology, 113381I (18 December 2019); doi: 10.1117/12.2543966
Published in SPIE Proceedings Vol. 11338:
AOPC 2019: Optical Sensing and Imaging Technology
John E. Greivenkamp; Jun Tanida; Yadong Jiang; HaiMei Gong; Jin Lu; Dong Liu, Editor(s)
PDF: 12 pages
Proc. SPIE 11338, AOPC 2019: Optical Sensing and Imaging Technology, 113381I (18 December 2019); doi: 10.1117/12.2543966
Show Author Affiliations
Jian Dong, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Fengyun He, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Fengyun He, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Xingzhen Bao, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Published in SPIE Proceedings Vol. 11338:
AOPC 2019: Optical Sensing and Imaging Technology
John E. Greivenkamp; Jun Tanida; Yadong Jiang; HaiMei Gong; Jin Lu; Dong Liu, Editor(s)
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