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Measurement and characterization of feature parameters for assembly parts based on blue structured light
Author(s): Sijia Liu; Guangxi Dong; Lingbao Kong; Lizhe Qi
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Paper Abstract

The structured light fields can be spoiled by the noisy environmental light. The defects will occur in reconstructive process due to the enormous change of surface reflectivity, which may ruin the results of the measurement. Thus, a structured light measuring system was proposed in this paper, taking the advantages of blue structured light, to reduce the disturbance of noise. A set of geometric feature parameters are proposed for characterizing the assembling errors of assembly parts, and the corresponding computation algorithms are presented based on the measured scattered points data. The proposed method can effectively reduce the influence of reflective deficiency. Experimental studies have been undertaken by measuring an assembly parts made by aluminum alloy, the measured results are also compared with those by a robotic coordinate measuring machine from Hexagon. The results show that the proposed measurement method and the developed system provides an efficient non-contact way for analyzing the feature parameters for assembly parts with high reflective surface in a high precision.

Paper Details

Date Published: 20 December 2019
PDF: 7 pages
Proc. SPIE 11209, Eleventh International Conference on Information Optics and Photonics (CIOP 2019), 112091B (20 December 2019); doi: 10.1117/12.2543889
Show Author Affiliations
Sijia Liu, Fudan Univ. (China)
Guangxi Dong, Fudan Univ. (China)
Lingbao Kong, Fudan Univ. (China)
Lizhe Qi, Fudan Univ. (China)


Published in SPIE Proceedings Vol. 11209:
Eleventh International Conference on Information Optics and Photonics (CIOP 2019)
Hannan Wang, Editor(s)

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