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Proceedings Paper

IR-SNOM on a fork: infrared scanning near-field optical microscopy for thermal profiling of quantum cascade lasers
Author(s): B.-J. Pandey; K. P. Clark; F. Abbas; E. Fuchs; K. Lascola; Yamac Dikmelik; D. Hinojos; K. Hodges; D. I. Robbins; M. Platkov; A. Katzir; A. Suliman; G. Spingarn; A. Niguès; J.-F. Veyan; Q. Gu; K. Roodenko
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Paper Abstract

The fundamental optical diffraction in infrared microscopes limits their spatial resolution to about ~5μm and hinders the detailed observation of heat generation and dissipation behaviors in micrometer-sized optoelectronic and semiconductor devices, thus impeding the understanding of basic material properties, electrical shorts and structural defects at a micron and sub-micron scale. We report the recent development of a scanning near-field optical microscopy (SNOM) method for thermal imaging with subwavelength spatial resolution. The system implements infrared fiber-optic probes with subwavelength apertures at the apex of a tip for coupling to thermal radiation. Topographic imaging and tip-to-sample distance control are enabled by the implementation of a macroscopic aluminum tuning fork of centimeter size to support IR thermal macro-probes. The SNOM-on-a-fork system is developed as a capability primarily for the thermal profiling of MWIR quantum cascade lasers (QCLs) during pulsed and continuous wave (CW) operation, targeting QCL design optimization. Time-resolved thermal measurements with high spatial resolution will enable better understanding of thermal effects that can have a significant impact on a laser's optical performance and reliability, and furthermore, will serve as a tool to diagnose failure mechanisms.

Paper Details

Date Published: 31 January 2020
PDF: 8 pages
Proc. SPIE 11288, Quantum Sensing and Nano Electronics and Photonics XVII, 112881Q (31 January 2020); doi: 10.1117/12.2543849
Show Author Affiliations
B.-J. Pandey, Max-IR Labs., LLC (United States)
K. P. Clark, Max-IR Labs., LLC (United States)
F. Abbas, The Univ. of Texas at Dallas (United States)
E. Fuchs, Zyvex Labs (United States)
K. Lascola, Thorlabs Quantum Electronics (United States)
Yamac Dikmelik, Thorlabs Quantum Electronics (United States)
D. Hinojos, Max-IR Labs., LLC (United States)
K. Hodges, Max-IR Labs., LLC (United States)
The Univ. of Texas at Dallas (United States)
D. I. Robbins, Max-IR Labs., LLC (United States)
M. Platkov, Tel-Aviv Univ. (Israel)
A. Katzir, Tel Aviv Univ. (Israel)
A. Suliman, Hamamatsu Corp. (United States)
G. Spingarn, Hamamatsu Corp. (United States)
A. Niguès, Lab. de Physique Statistique de l’Ecole Normale Superieure, CNRS, PSL Research Univ. (France)
J.-F. Veyan, The Univ. of Texas at Dallas (United States)
Q. Gu, The Univ. of Texas at Dallas (United States)
K. Roodenko, Max-IR Labs., LLC (United States)
The Univ. of Texas at Dallas (United States)


Published in SPIE Proceedings Vol. 11288:
Quantum Sensing and Nano Electronics and Photonics XVII
Manijeh Razeghi; Jay S. Lewis; Giti A. Khodaparast; Pedram Khalili, Editor(s)

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