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Proceedings Paper

Measurement of laser damage threshold of CdSiP2 at 1064 nm and 1550 nm
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Paper Abstract

Laser damage thresholds of CdSiP2 have previously been measured at wavelengths of 1064 nm and 2090 nm using nanosecond durations lasers1,2 and at 1940 nm using a continuous wave laser3. In the continuous wave measurement attempted in the past3, the CdSiP2 sample was found to withstand an irradiance of 150 kW/cm2 for over 60 seconds without any damage to the sample, whereas earlier grown samples of CdSiP2 exposed to the same irradiance level damaged in 5 seconds or less. In that work, or in any other work to our knowledge, the samples were not exposed to millisecond or longer duration lasers at 1064 nm or 1550 nm. Because of the importance of CdSiP2 in nonlinear frequency conversion of lasers in the 1000 to 2000 nm spectral range, this study was performed to measure the damage thresholds at wavelengths in this spectral regime. Results of the damage threshold at different laser spot sizes will be presented.

Paper Details

Date Published: 2 March 2020
PDF: 6 pages
Proc. SPIE 11264, Nonlinear Frequency Generation and Conversion: Materials and Devices XIX, 112640X (2 March 2020); doi: 10.1117/12.2543795
Show Author Affiliations
Amelia Carpenter, Air Force Research Lab. (United States)
Kevin T. Zawilski, BAE Systems (United States)
Peter G. Schunemann, BAE Systems (United States)
San-Hui Chi, Air Force Research Lab. (United States)
Shekhar Guha, Air Force Research Lab. (United States)

Published in SPIE Proceedings Vol. 11264:
Nonlinear Frequency Generation and Conversion: Materials and Devices XIX
Peter G. Schunemann; Kenneth L. Schepler, Editor(s)

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