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Proceedings Paper

Systematic error analysis of line-structured light calibration
Author(s): Zhongwen Fei; Zhiying Tan; Xiaobin Xu; Kaiyuan Zhu; Guangyu Su
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Paper Abstract

Three-dimensional contour imaging is used to reconstruct the surface of complex contour. Line-structured light is characterized by fast measurement, large amount of data and nondestructive to contour surface and is widely used in 3-D imaging. Therefore, a series of calibration methods for line-structured light are also produced, such as cross-ratio invariance, triangulation method, polynomial and so on. However, the traditional calibration methods are complex and take a long time, so a simplified method is proposed. This method omits the complicated process of calculating the cross-ratio and obtains the equation of light plane by accurately calculating the external parameters between the target and the camera and get the 3-D points of the line-structured light by the pinhole camera model. What’s more, RANSAC is applied to get the more precious line-structured light plane by eliminating the wrong points. Moreover, errors are measured and analyzed during the process of structure light calibration.

Paper Details

Date Published: 18 December 2019
PDF: 7 pages
Proc. SPIE 11338, AOPC 2019: Optical Sensing and Imaging Technology, 113381D (18 December 2019); doi: 10.1117/12.2543717
Show Author Affiliations
Zhongwen Fei, Hohai Univ. (China)
Zhiying Tan, Hohai Univ. (China)
Xiaobin Xu, Hohai Univ. (China)
Kaiyuan Zhu, Hohai Univ. (China)
Guangyu Su, Hohai Univ. (China)

Published in SPIE Proceedings Vol. 11338:
AOPC 2019: Optical Sensing and Imaging Technology
John E. Greivenkamp; Jun Tanida; Yadong Jiang; HaiMei Gong; Jin Lu; Dong Liu, Editor(s)

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