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Proceedings Paper

Quality control optical characterization of NIR VCSEL based light sources for 3D imaging applications
Author(s): Pierre Boher; Thierry Leroux; Véronique Collomb-Patton
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Paper Abstract

Low cost and compact 3D imaging for various applications like face-recognition, machine vision or LIDAR for automotive has introduced new requirements in terms of NIR light source characterization. These sources must comply safety regulations and must be verified rapidly and accurately during the fabrication process. In addition, precise characterization of the light source emissions within their entire angular aperture is mandatory to get accurate 3D images. The paper introduces a new Fourier optics system dedicated to this task.

Paper Details

Date Published: 24 February 2020
PDF: 8 pages
Proc. SPIE 11300, Vertical-Cavity Surface-Emitting Lasers XXIV, 1130006 (24 February 2020); doi: 10.1117/12.2543520
Show Author Affiliations
Pierre Boher, ELDIM (France)
Thierry Leroux, ELDIM (France)


Published in SPIE Proceedings Vol. 11300:
Vertical-Cavity Surface-Emitting Lasers XXIV
Luke A. Graham; Chun Lei, Editor(s)

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