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Proceedings Paper

Variable angle terahertz reflectance measurement based on fiber-type terahertz time-domain spectrometer
Author(s): Qing Sun; Zheng Li; Meiqi Feng; Yuqiang Deng; Liang Shang
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Paper Abstract

A fiber-type terahertz time-domain spectrometer was developed by combining fiber femtosecond laser with fiber-coupled terahertz photoconductive antenna. And variable angle terahertz reflectance of high-resistance silicon wafer and composite absorbent material was measured using this spectrometer. The measurement results are in good agreement with the theoretical calculation results.

Paper Details

Date Published: 18 December 2019
PDF: 5 pages
Proc. SPIE 11334, AOPC 2019: Optoelectronic Devices and Integration; and Terahertz Technology and Applications, 113341M (18 December 2019); doi: 10.1117/12.2543451
Show Author Affiliations
Qing Sun, National Institute of Metrology (China)
Zheng Li, National Institute of Metrology (China)
Qufu Normal Univ. (China)
Meiqi Feng, National Institute of Metrology (China)
Yuqiang Deng, Qufu Normal Univ. (China)
Liang Shang, Qufu Normal Univ. (China)


Published in SPIE Proceedings Vol. 11334:
AOPC 2019: Optoelectronic Devices and Integration; and Terahertz Technology and Applications
Zhiping Zhou; Xiao-Cong Yuan; Daoxin Dai, Editor(s)

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