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Proceedings Paper

Dynamic detection system for thermocouple cable insulation defects based on line scan camera
Author(s): Chun Liu; Runze Wang; Ye Li; Yong Jiang; Lei Wang; Beixing Qian
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Paper Abstract

In this paper, a dynamic detection system for thermocouple cable insulation defects is proposed. The common thermocouple cable defects are insulation cracking and cable joints. These two defects can be identified by detecting the cable diameter. Detecting such defects through the human eye is time consuming and labor intensive and does not guarantee quality. The method in this paper is to make the thermocouple line pass the field of view of the line camera when moving at high speed. Then use the edge detection algorithm to calculate the cable diameter. After comparing with the standard cable diameter, analyze whether the cable is normal or there is a defect in the joint or the insulation layer. In this paper, the edge detection algorithm is used to realize the dynamic detection of thermocouple cable defects. Improve the reliability of the products, improve the mechanization of the production process, and in a result of labor saving.

Paper Details

Date Published: 12 March 2020
PDF: 5 pages
Proc. SPIE 11438, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, 114380I (12 March 2020); doi: 10.1117/12.2543357
Show Author Affiliations
Chun Liu, Beijing Institute of Spacecraft Environment Engineering (China)
Runze Wang, Beijing Institute of Spacecraft Environment Engineering (China)
Ye Li, Beijing Institute of Spacecraft Environment Engineering (China)
Yong Jiang, Beijing Institute of Spacecraft Environment Engineering (China)
Lei Wang, Beijing Institute of Spacecraft Environment Engineering (China)
Beixing Qian, Beijing Institute of Spacecraft Environment Engineering (China)


Published in SPIE Proceedings Vol. 11438:
2019 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology
Guohai Situ; Xun Cao; Wolfgang Osten, Editor(s)

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