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Proceedings Paper

Direct, real-time, high-resolution beam profiler for high-power laser
Author(s): M. Tsunekane; K. Sato; T. Takahashi; S. Yoshino; N. Yoshimori; J. Ohno
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Paper Abstract

Fluorescence Imaging technology combined with a thin, linear-response fluorescent plate and a camera was developed for real-time 2D beam profiling of a raw beam of a high-power laser in the wavelength range from blue to near infrared. The input laser beam was slightly absorbed on the fluorescent plate in front top of the profiler body and generated 2D fluorescence image, that was precise reproduction of the laser beam profile at the place, was reimaged by a camera at the back side of the profiler. The laser beam that transferred the fluorescent plate was separated by a dichroic mirror and outputted from the body. >99% energy of the input laser beam transferred the fluorescent plate, then the heat generation in the fluorescent plate was very low. This made long-time, stable measurement of the high power, raw laser beam profile possible. >2MW/cm2 damage threshold of the fluorescent plate and the efficient heat management made direct measurement of >100W laser beam profiles possible without any attenuators and any computer-aided image reconstructions. Speckle-free and interference fringe-free, high-resolution images were also successfully obtained by the incoherent fluorescence reimaging.

Paper Details

Date Published: 2 March 2020
PDF: 6 pages
Proc. SPIE 11273, High-Power Laser Materials Processing: Applications, Diagnostics, and Systems IX, 1127307 (2 March 2020); doi: 10.1117/12.2543354
Show Author Affiliations
M. Tsunekane, Canare Electric Co., Ltd. (Japan)
K. Sato, Canare Electric Co., Ltd. (Japan)
T. Takahashi, Canare Electric Co., Ltd. (Japan)
S. Yoshino, Canare Electric Co., Ltd. (Japan)
N. Yoshimori, Canare Electric Co., Ltd. (Japan)
J. Ohno, Canare Electric Co., Ltd. (Japan)

Published in SPIE Proceedings Vol. 11273:
High-Power Laser Materials Processing: Applications, Diagnostics, and Systems IX
Stefan Kaierle; Stefan W. Heinemann, Editor(s)

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