
Proceedings Paper
Wavelet-based denoising analysis for polarized scanning atmospheric correctorFormat | Member Price | Non-Member Price |
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Paper Abstract
To obtain high accuracy polarization observation information is highly expecting in aerosol parameter retrieval and atmosphere environment research. In this paper, we described a space-borne multispectral polarized scanning atmospheric corrector (PSAC), which can provide extremely high polarimetric accuracy. And we use wavelet-based denoising method to improve the stability of PSAC measurement results by reducing internal noise. The result shows that the STD of DOLP difference between PSAC measurement value and theoretical value is significantly reduced, reached 5%~10% in the requirement DOLP difference accuracy 0.5%, the proposed threshold function can increase the evaluation accuracy stability of instrument polarization and reduce the uncertainty, also, the measurement results of PSAC inflight improved as well.
Paper Details
Date Published: 18 December 2019
PDF: 7 pages
Proc. SPIE 11338, AOPC 2019: Optical Sensing and Imaging Technology, 1133816 (18 December 2019); doi: 10.1117/12.2543301
Published in SPIE Proceedings Vol. 11338:
AOPC 2019: Optical Sensing and Imaging Technology
John E. Greivenkamp; Jun Tanida; Yadong Jiang; HaiMei Gong; Jin Lu; Dong Liu, Editor(s)
PDF: 7 pages
Proc. SPIE 11338, AOPC 2019: Optical Sensing and Imaging Technology, 1133816 (18 December 2019); doi: 10.1117/12.2543301
Show Author Affiliations
Xuefeng Lei, Univ. of Science and Technology of China (China)
Anhui Institute of Optics and Fine Mechanics (China)
Fei Tao, Anhui Institute of Optics and Fine Mechanics (China)
Zhenhai Liu, Anhui Institute of Optics and Fine Mechanics (China)
Anhui Institute of Optics and Fine Mechanics (China)
Fei Tao, Anhui Institute of Optics and Fine Mechanics (China)
Zhenhai Liu, Anhui Institute of Optics and Fine Mechanics (China)
Congfei Li, Anhui Institute of Optics and Fine Mechanics (China)
Shuangshuang Zhu, Univ. of Science and Technology of China (China)
Anhui Institute of Optics and Fine Mechanics (China)
Jin Hong, Anhui Institute of Optics and Fine Mechanics (China)
Shuangshuang Zhu, Univ. of Science and Technology of China (China)
Anhui Institute of Optics and Fine Mechanics (China)
Jin Hong, Anhui Institute of Optics and Fine Mechanics (China)
Published in SPIE Proceedings Vol. 11338:
AOPC 2019: Optical Sensing and Imaging Technology
John E. Greivenkamp; Jun Tanida; Yadong Jiang; HaiMei Gong; Jin Lu; Dong Liu, Editor(s)
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