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Proceedings Paper

Study on infrared collimation heating technology in thermal vacuum tests
Author(s): Chao Fan; Yanqiang Bi; Jing Wang; Ke Xu; Junwu Deng; Guoqing Liu
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Paper Abstract

The large-scale space structures may undergo unstable Thermally Induced Vibration (TIV), called thermal-flutter, on orbit due to the special incidence angle of solar heat flux. Compared with TIV, thermal flutter can cause more serious damage to the large-scale space structures. In this paper, the primary objective of the research is to develop a method for obtaining collimating heat flux so that thermal-flutter phenomenon can be observed in the laboratory experiment. Based on the non-imaging optics theory, a parabolic reflector for infrared lamp was designed and machined. The results show that the infrared lamp array with parabolic reflector can provide collimating heat flux and the method is feasible and effective.

Paper Details

Date Published: 12 March 2020
PDF: 8 pages
Proc. SPIE 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 114390R (12 March 2020); doi: 10.1117/12.2543276
Show Author Affiliations
Chao Fan, Beijing Institute of Spacecraft Environment Engineering (China)
National Key Lab. of Science and Technology on Reliability and Environmental Engineering (China)
Yanqiang Bi, Beijing Institute of Spacecraft Environment Engineering (China)
Jing Wang, Beijing Institute of Spacecraft Environment Engineering (China)
National Key Lab. of Science and Technology on Reliability and Environmental Engineering (China)
Ke Xu, Beijing Institute of Spacecraft Environment Engineering (China)
Junwu Deng, Beijing Institute of Spacecraft Environment Engineering (China)
Guoqing Liu, Beijing Institute of Spacecraft Environment Engineering (China)
National Key Lab. of Science and Technology on Reliability and Environmental Engineering (China)


Published in SPIE Proceedings Vol. 11439:
2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Kexin Xu; Hai Xiao; Sen Han, Editor(s)

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