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High precision 2D-displacement measurement of lattice pattern using image processing
Author(s): Yasushi Niitsu D.D.S.; Takehiro Takahashi D.D.S.; Shigeru Hirano D.D.S.; Kenji Gomi D.D.S.
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Paper Abstract

2D-displacement measurement with real time image processing is developed. The target of camera image is a lattice pattern drawn on the paper sheet. The range of measurement depends only on the size of target sheet, so that high resolution power as well as large measuring range are realized with proposal method. The histogram distribution of the image of the lattice pattern is calculated, and the position of the grid lines are detected from the peak positions of the distribution. By continuously performing this detection, it is possible to calculate the movement of the image. From the target grid lines spacing (in mm) and the grid lines spacing on the image (in pixels), the calculation of the displacement is done automatically. The features of this method are that real-time measurement can be performed with high-speed processing, measurement can be easily performed simply by setting the grid line interval (mm), and measurement can be performed with sub-pixel accuracy. In this research, the measurement accuracy and the tolerance to poor image quality of the proposed method were evaluated. As a result, it has been shown that the position of the grid line can be detected with sub-pixel accuracy even in a poor-quality image. As an application of this method, the relative displacement between the base and tested building was obtained with the measurement during 3-dimensional vibration tests.

Paper Details

Date Published: 16 October 2019
PDF: 8 pages
Proc. SPIE 11205, Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019), 1120523 (16 October 2019); doi: 10.1117/12.2543171
Show Author Affiliations
Yasushi Niitsu D.D.S., Tokyo Denki Univ. (Japan)
Takehiro Takahashi D.D.S., Ichijo Housing Co., Ltd. (Japan)
Shigeru Hirano D.D.S., Ichijo Housing Co., Ltd. (Japan)
Kenji Gomi D.D.S., Tokyo Denki Univ. (Japan)


Published in SPIE Proceedings Vol. 11205:
Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019)
Anand Asundi; Motoharu Fujigaki; Huimin Xie; Qican Zhang; Song Zhang; Jianguo Zhu; Qian Kemao, Editor(s)

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