
Proceedings Paper
Research on scene-based IRFPA non-uniformity correction technologyFormat | Member Price | Non-Member Price |
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Paper Abstract
The non-uniform response of infrared focal plane array (IRFPA) detectors has a serious impact on image quality. First, the image is not clear visually, there are serious fixed mode noise, and second, the dynamic range, which reduces the resolution of infrared image. In view of the shortcomings of the existing non-uniformity correction schemes and the actual engineering requirements, this paper proposes a scheme combining registration-based correction algorithm with micro-motion system, which calculates the relative displacement between two adjacent images by projection estimation. At this time, the scene motion is judged. When the motion is inadequate, the scene motion is controlled to make the controller operate according to a certain trajectory, so that the scene conditions can meet the requirements of the correction algorithm as far as possible, solve the practical application requirements, make the image quality achieve better results, and perform the performance of the algorithm. The test results show that the scheme can effectively correct the non-uniformity and obtain better correction effect.
Paper Details
Date Published: 12 March 2020
PDF: 8 pages
Proc. SPIE 11441, 2019 International Conference on Optical Instruments and Technology: IRMMW-THz Technologies and Applications, 1144109 (12 March 2020); doi: 10.1117/12.2543157
Published in SPIE Proceedings Vol. 11441:
2019 International Conference on Optical Instruments and Technology: IRMMW-THz Technologies and Applications
Cunlin Zhang; Xi-Cheng Zhang; Zhiming Huang, Editor(s)
PDF: 8 pages
Proc. SPIE 11441, 2019 International Conference on Optical Instruments and Technology: IRMMW-THz Technologies and Applications, 1144109 (12 March 2020); doi: 10.1117/12.2543157
Show Author Affiliations
Lin Zhu, Nanjing Univ. of Science and Technology (China)
Xiaoyong Jiang, Beijing Institute of Radio Metrology and Measurement (China)
Xiubao Sui, Nanjing Univ. of Science and Technology (China)
Xiaoyong Jiang, Beijing Institute of Radio Metrology and Measurement (China)
Xiubao Sui, Nanjing Univ. of Science and Technology (China)
Published in SPIE Proceedings Vol. 11441:
2019 International Conference on Optical Instruments and Technology: IRMMW-THz Technologies and Applications
Cunlin Zhang; Xi-Cheng Zhang; Zhiming Huang, Editor(s)
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