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Proceedings Paper

Large field of view macroscopic Raman line-scanning imaging system for neuro-oncology applications (Conference Presentation)
Author(s): Francois Daoust; Patrick Orsini; Jacques Bismuth; Marie-Maude de Denus-Baillargeon; Israel Veilleux; Alexandre Wetter; Philippe McKoy; Isabelle Dicaire; Maroun Massabki; Kevin Petrecca; Frédéric Leblond

Paper Abstract

We present the development and preliminary results of a novel intraoperative line-scanning Raman imaging system, developed for neurosurgery applications. The system records fingerprint Raman spectral images over a large field of view of 1.0cm2 through a handheld imaging probe placed in gentle contact with the interrogated tissue. With a spatial resolution of 250µm2 and an acquisition time on the order of 10s, brain structure margins can be identified within an adequate timeframe for clinical applications. The system was designed using detailed optical simulations and its performance was verified on tissue phantoms and in vivo on animals using our laboratory’s Raman point system as reference.

Paper Details

Date Published: 9 March 2020
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Proc. SPIE 11236, Biomedical Vibrational Spectroscopy 2020: Advances in Research and Industry, 112360E (9 March 2020); doi: 10.1117/12.2543047
Show Author Affiliations
Francois Daoust, Polytechnique Montréal (Canada)
Ctr. de Recherche du Ctr. Hospitalier de l’Univ. de Montréal (Canada)
Patrick Orsini, OPTECH Montreal (Canada)
Jacques Bismuth, OPTECH Montreal (Canada)
Marie-Maude de Denus-Baillargeon, OPTECH Montreal (Canada)
Israel Veilleux, Polytechnique Montréal (Canada)
Alexandre Wetter, OPTECH Montreal (Canada)
Philippe McKoy, OPTECH Montreal (Canada)
Isabelle Dicaire, OPTECH Montreal (Canada)
Maroun Massabki, OPTECH Montreal (Canada)
Kevin Petrecca, Montreal Neurological Institute and Hospital (Canada)
Frédéric Leblond, Polytechnique Montréal (Canada)
Ctr. de Recherche du Ctr. Hospitalier de l’Univ. de Montréal (Canada)


Published in SPIE Proceedings Vol. 11236:
Biomedical Vibrational Spectroscopy 2020: Advances in Research and Industry
Wolfgang Petrich; Zhiwei Huang, Editor(s)

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