Share Email Print

Proceedings Paper

Picometer level spatial metrology for next generation telescopes
Author(s): Babak Saif; Ritva Keski-Kuha; Perry Greenfield; Michael North-Morris; Marcel Bluth; Lee Feinberg; J. C. Wyant; S. Park
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Future space observatory missions require controlling wave front error and system alignment stability to picometer scale. Picometer stability performance demands precision knowledge of the mirror and metering structure materials to the same level. A high-speed electronic speckle pattern interferometer was designed and built to demonstrate measurements of both static and dynamic responses of picometer level amplitudes in mirror and structural materials subjected to very low energy disturbances. This paper summarizes the current status of tests to impart a dynamic disturbance of picometer scale and measure the response of specular and diffuse materials. The results show that subpicometer scale effects can be accurately measured in an open test environment outside a vacuum chamber.

Paper Details

Date Published: 9 September 2019
PDF: 8 pages
Proc. SPIE 11115, UV/Optical/IR Space Telescopes and Instruments: Innovative Technologies and Concepts IX, 111150K (9 September 2019); doi: 10.1117/12.2543034
Show Author Affiliations
Babak Saif, NASA Goddard Space Flight Ctr. (United States)
Ritva Keski-Kuha, NASA Goddard Space Flight Ctr. (United States)
Perry Greenfield, Space Telescope Science Institute (United States)
Michael North-Morris, 4D Technology Corp. (United States)
Marcel Bluth, Intuitive Machines (United States)
Lee Feinberg, NASA Goddard Space Flight Ctr. (United States)
J. C. Wyant, James C. Wyant College of Optical Sciences (United States)
S. Park, Harvard-Smithsonian Ctr. for Astrophysics (United States)

Published in SPIE Proceedings Vol. 11115:
UV/Optical/IR Space Telescopes and Instruments: Innovative Technologies and Concepts IX
Allison A. Barto; James B. Breckinridge; H. Philip Stahl, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?