Share Email Print
cover

Proceedings Paper

Improvement of the quality of the interferogram based on the Gaussian process regression
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Interferometric techniques are very important in the metrology field, while the quality of the interferogram will directly affect the retrieval phase of the tested object. This paper presents a method to improve the quality of the interferogram including restoration of noise aliasing and moiré distortion by using the Gaussian Process Regression (GPR). Through choosing a suitable covariance function to describe the relationship between points and points in the fringe pattern, we build a Gaussian process regression model of interferogram, denoise the interferogram and improve the resolution at the same time. The treated interferogram can predict and compensate the part of the fringe distortion and enlarge the depth range of the interferometric measurement. Besides, with the resolution elevated of the hologram, a wider spectrum range can be obtained. In order to verify the possibility of this method, several simulations have been done, which showed a good performance in the enhancement of the quality of interferogram.

Paper Details

Date Published: 16 October 2019
PDF: 6 pages
Proc. SPIE 11205, Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019), 112051M (16 October 2019); doi: 10.1117/12.2542931
Show Author Affiliations
Dingfu Chen, Shanghai Univ. (China)
Yingjie Yu, Shanghai Univ. (Brazil)
Jiaqi Shi, Shanghai Univ. (China)


Published in SPIE Proceedings Vol. 11205:
Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019)
Anand Asundi; Motoharu Fujigaki; Huimin Xie; Qican Zhang; Song Zhang; Jianguo Zhu; Qian Kemao, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray