Share Email Print

Proceedings Paper

Measurement of small optics by use of a multi-wavelength interferometrical approach
Author(s): Marc Wendel
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A new approach for measurement of small and thin lenses is introduced, based on the combination of long and short coherence interferometrical point probe systems in one measurement device. The basic working principle, as well as first results, are presented, and the benefits of this approach are highlighted.

Paper Details

Date Published: 30 December 2019
PDF: 5 pages
Proc. SPIE 11385, Optics and Measurement International Conference 2019, 113850M (30 December 2019); doi: 10.1117/12.2542914
Show Author Affiliations
Marc Wendel, Ametek GmbH (Germany)

Published in SPIE Proceedings Vol. 11385:
Optics and Measurement International Conference 2019
Jana Kovačičinová, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?