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Proceedings Paper

Research on passive wide-band uncooled infrared imaging detection technology for gas leakage
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Paper Abstract

Aiming at the requirements of gas detection in petroleum, petrochemical, power equipment and air pollution monitoring, some key technologies in passive uncooled gas leakage infrared imaging detection system are analyzed. Based on the gas absorption line intensity and absorption peak position in the standard infrared database, the key components such as MW and LW infrared optical lens and wide band uncooled infrared focal plane detector are optimized. Considering the imaging signal-to-noise ratio and signal contrast, the filter used in several typical gas detections is analyzed, and an online and handheld gas leakage infrared imaging detection system capable of detecting multiple gases is designed. Theoretically, it is possible to detect gas with characteristic absorption in the range of 3-14 μm. The imaging effects of carbon dioxide gas, methane gas and sulfur hexafluoride gas with absorption peaks in MW and LW bands were measured. The test results show that the uncooled infrared gas detection system designed in this paper not only has good imaging detection ability for sulfur hexafluoride gas and ethylene gas (near 10.5 μm) with large absorption intensity and absorption peak in conventional LW band, but also for methane gas (near 7.5μm or 3.3μm) and carbon dioxide gas (near 4.2 μm) with absorption peak in unconventional LW band. In the laboratory environment, with the black body as the background, the gas flow rate is controlled by the gas mass flow meter to observe the imaging detection effects under different temperature differences and different flow rates. When the target and background temperature difference is 5K, the gas detection ability is ≤100mL/min.

Paper Details

Date Published: 12 March 2020
PDF: 14 pages
Proc. SPIE 11434, 2019 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 114340H (12 March 2020); doi: 10.1117/12.2542906
Show Author Affiliations
Xu Zhang, Beijing Institute of Technology (China)
Weiqi Jin, Beijing Institute of Technology (China)
Pan Yuan, Beijing Institute of Technology (China)
Chao Qin, Beijing Institute of Technology (China)
Hongchen Wang, IRay Technology Co., Ltd. (China)
Ji Chen, Yunnan KIRO-CH Photonics Co., Ltd. (China)
Xuan Jia, Beijing Daan Application Technology Co., Ltd. (China)


Published in SPIE Proceedings Vol. 11434:
2019 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Juan Liu; Baohua Jia; Xincheng Yao; Yongtian Wang; Takanori Nomura, Editor(s)

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