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The ionization dose radiation effects of analog front-end for satellite-borne directional polarization camera
Author(s): Ping-ping Yao; Bi-hai Tu; Di Hu Chen; Mei Na Lu; Dong Gen Luo; Jin Hong
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Paper Abstract

This paper studies the effect of the analog front-end signal processor in CCD imaging system on the total ionizing dose radiation effect after 60Co-gamma-ray irradiation, and focuses on the change of the device's static operating current, low-level reference voltage, high-level reference voltage and dynamic output digital code signal. The results show that after certain dose radiation, the static operating current increases significantly with the total dose increase, the high and low reference voltage decreases with the total dose increase, and the dynamic output signal does not correspond to the input signal with the increase of the total dose. The above work can provide reference for in-depth study of radiation reinforcement and radiation damage assessment of analog front-end signal processors in space application environment.

Paper Details

Date Published: 20 December 2019
PDF: 7 pages
Proc. SPIE 11209, Eleventh International Conference on Information Optics and Photonics (CIOP 2019), 112090R (20 December 2019); doi: 10.1117/12.2542896
Show Author Affiliations
Ping-ping Yao, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China)
Key Lab. of Optical Calibration and Characterization (China)
Bi-hai Tu, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China)
Key Lab. of Optical Calibration and Characterization (China)
Di Hu Chen, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China)
Key Lab. of Optical Calibration and Characterization (China)
Mei Na Lu, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China)
Key Lab. of Optical Calibration and Characterization (China)
Dong Gen Luo, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China)
Key Lab. of Optical Calibration and Characterization (China)
Jin Hong, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China)
Key Lab. of Optical Calibration and Characterization (China)


Published in SPIE Proceedings Vol. 11209:
Eleventh International Conference on Information Optics and Photonics (CIOP 2019)
Hannan Wang, Editor(s)

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