Share Email Print

Proceedings Paper

Noise characterization of megapixel quanta image sensor for scientific applications
Author(s): Dakota S. Robledo; Yu-Wing Chung; Saleh Masoodian; Jiaju Ma
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The quanta image sensor (QIS) is a novel CMOS-based image sensor capable of photon counting without the necessity of avalanche gain. The QIS reported in this work is implemented in a state-of-the-art backside-illuminated (BSI) CMOS image sensor commercial stacking (3D) process. The detector wafer consists of a megapixel array of specialized active pixels known as “jots” and the ASIC readout wafer utilizes cluster-based readout circuitry. This specialized pixel architecture and cluster readout circuits allow for the QIS to achieve accurate photon-counting capabilities with average read noise of 0.23e- rms, average conversion gain of 345μV/e-, and average dark current less than 0.1e-/sec/jot at room temperature without active cooling.

Paper Details

Date Published: 31 January 2020
PDF: 8 pages
Proc. SPIE 11288, Quantum Sensing and Nano Electronics and Photonics XVII, 1128826 (31 January 2020); doi: 10.1117/12.2542862
Show Author Affiliations
Dakota S. Robledo, Gigajot Technology Inc. (United States)
Yu-Wing Chung, Gigajot Technology Inc. (United States)
Saleh Masoodian, Gigajot Technology Inc. (United States)
Jiaju Ma, Gigajot Technology Inc. (United States)

Published in SPIE Proceedings Vol. 11288:
Quantum Sensing and Nano Electronics and Photonics XVII
Manijeh Razeghi; Jay S. Lewis; Giti A. Khodaparast; Pedram Khalili, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?