Proceedings Paper
Study on the intensive submillimeter interlayer structures based on THz-TDS| Format | Member Price | Non-Member Price |
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Paper Abstract
Based on the terahertz time-domain spectrum (THz-TDS) system, the measurement results of multilayer submillimeter interlayer structures are analyzed. An algorithm is developed to extract the peak information of the corresponding reflection signal and restore the intensive submillimeter interlayer structure.
Paper Details
Date Published: 18 December 2019
PDF: 4 pages
Proc. SPIE 11337, AOPC 2019: Optical Spectroscopy and Imaging, 113370F (18 December 2019); doi: 10.1117/12.2542484
Published in SPIE Proceedings Vol. 11337:
AOPC 2019: Optical Spectroscopy and Imaging
Jin Yu; Zhe Wang; Vincenzo Palleschi; Mengxia Xie; Yuegang Fu, Editor(s)
PDF: 4 pages
Proc. SPIE 11337, AOPC 2019: Optical Spectroscopy and Imaging, 113370F (18 December 2019); doi: 10.1117/12.2542484
Show Author Affiliations
Tianhui Xu, Univ. of Electronic Science and Technology of China (China)
Kefei Li, Univ. of Electronic Science and Technology of China (China)
Kefei Li, Univ. of Electronic Science and Technology of China (China)
Wei Wang, Univ. of Electronic Science and Technology of China (China)
Key Lab. of Terahertz Technology (China)
Diwei Liu, Univ. of Electronic Science and Technology of China (China)
Key Lab. of Terahertz Technology (China)
Key Lab. of Terahertz Technology (China)
Diwei Liu, Univ. of Electronic Science and Technology of China (China)
Key Lab. of Terahertz Technology (China)
Published in SPIE Proceedings Vol. 11337:
AOPC 2019: Optical Spectroscopy and Imaging
Jin Yu; Zhe Wang; Vincenzo Palleschi; Mengxia Xie; Yuegang Fu, Editor(s)
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