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Proceedings Paper

Wavelength framing technique based on a diffractive optical element
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Paper Abstract

Framing camera is a powerful tool to investigate the ultrafast phenomena in chemical reaction process. Wavelength framing technique is one of the key technologies in the development of framing cameras. The wavelength resolution of the images generated by wavelength framing system determines the interval time of the wavelength framing camera, that is, the time resolution of the wavelength framing camera. In this paper, a wavelength framing system based on a diffractive optical element (DOE) and a band-pass filter (BPF) was set up. The wavelength characteristics of the wavelength framing system were simulated utilizing the theory of multi-beam interference. The central wavelength of each image got from the system, which varies with the position relationship between DOE and BPF, has been obtained. Experiments were carried out through imaging a target of 6 mm × 6 mm by using the wavelength framing system. The spectral characteristics of each image were also studied experimentally. The result we have got proves that the system we have generated can achieve 16-frame imaging, every image has different spectral properties. For the target with a size of 6 mm × 6 mm, the resolution of a single image got from the system is 610 × 610, and the central wavelength ranges from 784 nm to 814 nm. The average difference in central wavelength between adjacent images is 1.95 nm. If the dispersion of the incident pulse light source is 0.46 ps/nm, the time resolution of the system is 0.9 ps.

Paper Details

Date Published: 12 March 2020
PDF: 8 pages
Proc. SPIE 11434, 2019 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 114340E (12 March 2020); doi: 10.1117/12.2542475
Show Author Affiliations
Qifeng Li, Beijing Institute of Technology (China)
Zhuo Li, Beijing Institute of Technology (China)
Lang Zhou, Beijing Institute of Technology (China)
Sichen Zhang, Beijing Institute of Technology (China)
Yanjin Li, Beijing Institute of Technology (China)
Xin Wang, Beijing Institute of Technology (China)
Rui Shi, Lanshi Optics Technology Co., Ltd. (China)


Published in SPIE Proceedings Vol. 11434:
2019 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Juan Liu; Baohua Jia; Xincheng Yao; Yongtian Wang; Takanori Nomura, Editor(s)

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