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Proceedings Paper

Effect of corner radius on a single corner nanostructure for investigating SERS-based chemical sensors
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Paper Abstract

The essential broadening of the beam at the corner is a constraint in the fabrication which can be avoided by using the concept of corner radius in using lithography by electron beam technique. In the present study, we investigated single corner plasmonic nanostructure to observe the effect of corner radius in the enhancement of electromagnetic field and resonance wavelength. We explored different geometries of plasmonic nanostructures using simulation technique. Herein we report numerical modelling of plasmonic nanostructures to determine the enhancement in intensity and its resonance wavelength as a novel application in chemical sensor based on surface-enhanced Raman spectroscopy (SERS). Intensity enhancement factor decreases with increase in corner radii at fixed gap and with increase in gap at fixed corner radii in case of plasmonic nanobowtie, square and pentagon nanostructures. We have studied a different plasmonic nanostructure with greater enhancement factor by having both the sharper corner and shorter gap in comparison with other nanostructures. Further, we noticed the gap size effect is higher in comparison with the effect of corner radii on enhancement factor. The electric field enhancement factor is higher at larger corner radii in the case of our proposed plasmonic nanostructure as compare to other plasmonic geometries. Moreover, the single corner plasmonic nanostructures has been modelled and their near-field optical properties of nano shells and nano spheres has been examined so as to optimize our simulation parameters and to test for convergence.

Paper Details

Date Published: 2 March 2020
PDF: 9 pages
Proc. SPIE 11274, Physics and Simulation of Optoelectronic Devices XXVIII, 112741R (2 March 2020); doi: 10.1117/12.2542272
Show Author Affiliations
Nivedita Pandey, Indian Institute of Technology Bombay (India)
Abhishek Kumar, Indian Institute of Technology Bombay (India)
Subhananda Chakrabarti, Indian Institute of Technology Bombay (India)

Published in SPIE Proceedings Vol. 11274:
Physics and Simulation of Optoelectronic Devices XXVIII
Bernd Witzigmann; Marek Osiński; Yasuhiko Arakawa, Editor(s)

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