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Proceedings Paper

Accurate x-ray source dimension measurement by the spherically bent crystal imaging system
Author(s): Jin Shen; Weiquan Zhang; Guibin Zan; Zhanglang Xu; Xuewei Du; Qiuping Wang
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Paper Abstract

X-ray sources are widely used in non-destructive testing applications. The focal spot shape and size of an X-ray source are important factors that influence the resolution and contrast of images. A monochromatic imaging method using a spherically bent crystal is proposed to measure the focal spot size of X-ray sources. The natural emission spectral lines of the target material are imaged to distinguish the target from the substrate. Thus, the fine structures of the focal spot can be measured combined with high spatial resolution. With a backlight imaging experiment, the imaging system achieves a high spatial resolution of ~10 μm over a large field of view of 2.5 mm with a narrow energy band of 2 eV at 8.05 keV. The X-ray focal spot size of a laboratory X-ray source with a Cu anode is measured using the spherically bent crystal imaging system and a pinhole camera respectively. The spherically bent crystal imaging system provides high spatial resolution and additional details for the focal spot. Thus, the monochromatic imaging method is applicable for the accurate X-ray source dimension measurement.

Paper Details

Date Published: 20 December 2019
PDF: 8 pages
Proc. SPIE 11209, Eleventh International Conference on Information Optics and Photonics (CIOP 2019), 1120906 (20 December 2019); doi: 10.1117/12.2542256
Show Author Affiliations
Jin Shen, Univ. of Science and Technology of China (China)
Weiquan Zhang, Univ. of Science and Technology of China (China)
Guibin Zan, Univ. of Science and Technology of China (China)
Zhanglang Xu, Univ. of Science and Technology of China (China)
Xuewei Du, Univ. of Science and Technology of China (China)
Qiuping Wang, Univ. of Science and Technology of China (China)


Published in SPIE Proceedings Vol. 11209:
Eleventh International Conference on Information Optics and Photonics (CIOP 2019)
Hannan Wang, Editor(s)

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