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Proceedings Paper

Ultrafast optical pulse from non-paraxial beam-shaping to optical metrology (Conference Presentation)
Author(s): Simon Thibault; Charles Pichette; Pierre Marquet; Michel Piché

Paper Abstract

Ultrashort pulse light beam is an important tool in many areas of science and technology. It is used to study ultrafast phenomena to new imaging modalities. Because of its ultra-broad frequency bandwidth, it can be used to control, manipulate, and characterize light–matter interactions. Over the recent years, we have played with non-paraxial beams and short pulses new imaging modalities. However, we also found the ultrashort optical pulse of a fraction or few optical cycles may change many well-known assumptions in optical metrology. Here a few questions: • How the ultrashort pulse affects the diffraction point spread function? • Does ultrashort pulse interferometry to test optical component is possible? • How the far field and near field diffraction are affected by ultrashort pulse duration? • How vectorial beams are affected under short pulse and non-paraxial conditions? In this talk, we will try to introduce how ultrashort pulse may open a new area in optical metrology.

Paper Details

Date Published: 10 March 2020
Proc. SPIE 11278, Ultrafast Phenomena and Nanophotonics XXIV, 1127819 (10 March 2020); doi: 10.1117/12.2542108
Show Author Affiliations
Simon Thibault, Univ. Laval (Canada)
Charles Pichette, Univ. Laval (Canada)
Pierre Marquet, CERVO Brain Research Ctr. (Canada)
Michel Piché, Univ. Laval (Canada)

Published in SPIE Proceedings Vol. 11278:
Ultrafast Phenomena and Nanophotonics XXIV
Markus Betz; Abdulhakem Y. Elezzabi, Editor(s)

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