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Proceedings Paper

Peak force infrared microscopy for label-free chemical imaging at sub 10 nm spatial resolution
Author(s): Le Wang; Guanghong Zeng; Gilbert C. Walker; Xiaoji G. Xu
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Paper Abstract

Chemical characterization of materials at the nanoscale provides insights into their compositions and organizations. Infrared spectroscopy has been a powerful tool that directly indicates the identity and amount of functional groups of molecules by measuring the absorption of infrared light. However, nanoscale spatial resolution is hard to achieve for conventional Fourier-transform infrared (FTIR) spectroscopy because of the optical diffraction limit. Herein we reported a recently developed infrared microscopy and spectroscopy technique also based on infrared absorption of molecules – peak force infrared microscopy – that combines atomic force microscopy and infrared laser illumination. Sub 10 nanometer spatial resolution has been demonstrated on various samples, including block copolymers, hexagonal boron nitride flakes, and amyloid fibrils. Simultaneous chemical and mechanical mapping can be obtained with peak force infrared microscopy in that both information is encoded in the cantilever deflection curves during peak force tapping cycles. The high spatial resolution and multimodal measurement capability render peak force infrared microscopy a label-free chemical imaging technique for explorations of nanoscale across broad disciplines.

Paper Details

Date Published: 21 February 2020
PDF: 7 pages
Proc. SPIE 11252, Advanced Chemical Microscopy for Life Science and Translational Medicine, 112521L (21 February 2020); doi: 10.1117/12.2541976
Show Author Affiliations
Le Wang, Lehigh Univ. (United States)
Guanghong Zeng, DFM A/S (Denmark)
Gilbert C. Walker, Univ. of Toronto (Canada)
Xiaoji G. Xu, Lehigh Univ. (United States)


Published in SPIE Proceedings Vol. 11252:
Advanced Chemical Microscopy for Life Science and Translational Medicine
Ji-Xin Cheng; Wei Min; Garth J. Simpson, Editor(s)

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