Share Email Print
cover

Proceedings Paper

Study on non-phase-shifting phase retrieval methods for interferogram with large phase gradient
Author(s): Yao Hu; Xueyin Sun; Shaopu Wang; Mingzhe Ye; Qun Hao
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

As a non-contact, high-precision optical component testing method, interferometry performs the measurement by solving the interferogram containing the phase information of the object to be measured. The non-mechanical-phase-shifting phase retrieval method based on single or two interferograms has the advantages of good vibration resistance, fast speed and simple system, which can meet the increasingly urgent online and on-site detection requirements. Aiming at the large gradient phase detection requirements in processing, this paper compares the accuracy of typical non-mechanical-phaseshifting interferometric phase retrieval methods, including carrier Fourier method, digital moiré interferometry (DMI), and two DMI-based methods, namely two-step carrier stitching method and DMI combined with Newton iterative algorithm proposed by the authors. In this paper, the influences of the magnitude of the phase gradient and the noise of the interferogram on the phase retrieval accuracy of the above methods are analyzed. The simulation results in this paper will provide a theoretical basis for the selection of algorithms for in situ interferometry.

Paper Details

Date Published: 12 March 2020
PDF: 6 pages
Proc. SPIE 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 114390C (12 March 2020); doi: 10.1117/12.2541761
Show Author Affiliations
Yao Hu, Beijing Institute of Technology (China)
Xueyin Sun, China Aerospace Science and Technology Corp. (China)
Shaopu Wang, China Aerospace Science and Technology Corp. (China)
Mingzhe Ye, Beijing Institute of Technology (China)
Qun Hao, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 11439:
2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Kexin Xu; Hai Xiao; Sen Han, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray