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Noise analysis based on data comparison of IR thermal camera
Author(s): Elvira Rachim; Adi Farmasiantoro
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Paper Abstract

Sampling in the lab to get XTM640 data is part of the LWIR XTM640 camera calibration parameter. The XTM640 camera uses a 17μm pixel microbolometer sensor, at the time of operational data acquisition resistance changes according to the infrared radiation that affects it. XTM-640 is an extremely compact and versatile thermal camera module with unique image quality and stability for a broad range of OEM applications, it consists of an uncooled microbolometer. Uncooled microbolometer is known for its low cost. The method used in this paper is comparing the camera output sampling, to acquire how much the noise is, hence the result can be used as a future reference for calibration data.

Paper Details

Date Published: 24 December 2019
PDF: 7 pages
Proc. SPIE 11372, Sixth International Symposium on LAPAN-IPB Satellite, 113721S (24 December 2019); doi: 10.1117/12.2541715
Show Author Affiliations
Elvira Rachim, Indonesian National Institute of Aeronautics and Space (Indonesia)
Adi Farmasiantoro, Indonesian National Institute of Aeronautics and Space (Indonesia)


Published in SPIE Proceedings Vol. 11372:
Sixth International Symposium on LAPAN-IPB Satellite
Yudi Setiawan; Lilik Budi Prasetyo; Tien Dat Pham; Kasturi Devi Kanniah; Yuji Murayama; Kohei Arai; Gay Jane P. Perez, Editor(s)

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