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Proceedings Paper

Research on the influence of air turbulence of vertical long optical path on wave front detection
Author(s): ZiBo Jiang; Zhe Chen; SongFeng Kou
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Paper Abstract

Indoor air turbulence had a certain degree of influence on optical testing or optical system image quality. A long optical testing path was built in tower which was one of the largest vertical towers for optical testing in China with about 23-meter high. The relevant influence characteristics were measured and studied in a specific state. First, the air turbulence was formed using air conditionings. Then, the optical wave fronts were sampled by interferometer with two conditions of undisturbed situation and disturbed situation in which the air conditioners were turned on for a while and then turned off some time and sampling was beginning. After the statistical analyzing to the sampling results, the following several evaluation results of image quality were acquired in different status, the Radius of Encircled 80% Energy (REE), the evaluation factor of modulation transfer function (MTF), the Strehl Ratio (SR), the traditional evaluation method PV/RMS value of wave fronts, and the turbulent correlation length of atmospheric r0. The statistical calculation results showed that turbulence intensity increased and optical image quality was deteriorated after air disturbed.

Paper Details

Date Published: 18 December 2019
PDF: 10 pages
Proc. SPIE 11341, AOPC 2019: Space Optics, Telescopes, and Instrumentation, 113410G (18 December 2019); doi: 10.1117/12.2541711
Show Author Affiliations
ZiBo Jiang, National Astronomical Observatory (China)
Nanjing Institute of Astronomical Optics and Technology (China)
Zhe Chen, National Astronomical Observatory (China)
Nanjing Institute of Astronomical Optics and Technology (China)
SongFeng Kou, National Astronomical Observatory (China)
Nanjing Institute of Astronomical Optics and Technology (China)


Published in SPIE Proceedings Vol. 11341:
AOPC 2019: Space Optics, Telescopes, and Instrumentation
Suijian Xue; Xuejun Zhang; Carl Anthony Nardell; Ziyang Zhang, Editor(s)

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