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Proceedings Paper

Monte Carlo simulation of integrated blackbody infrared emissivity and verification
Author(s): Xu-yao Song; Qing-duo Duanmu; Wei Dong; Chun-teng Shao; Zhi-bin Li; Yi-jie Pan; Zun-dong Yuan; Jing-hui Wang
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Paper Abstract

Integrated blackbody is a blackbody radiation source with the emissivity approximate to 1, which is coupled of materials with different infrared emissivity as the cavity wall and the cavity bottom. The integrated blackbody theory is the theoretical basis of materials infrared spectral emissivity measurement device at ultra-high temperature developed by National Institute of Metrology, China (NIM). Infrared emissivity is the most important factor for evaluating the infrared radiation characteristics of integrated blackbody. Based on Monte Carlo simulation, infrared emissivity of the integrated blackbody coupled of different high emissivity materials and infrared emissivity of the integrated blackbody coupled of low emissivity material and high emissivity material are calculated theoretically in the near infrared wavelength band at room temperature and high temperature environment. The simulation results show that, the infrared emissivity of the integrated blackbody coupled of different high emissivity materials can reach 0.998 and the infrared emissivity of the integrated blackbody coupled of low emissivity material and high emissivity material can reach 0.988. The above simulation results of integrated blackbody infrared emissivity have reached the requirements of industrial blackbody radiation source. The simulation results are verified based on the method of blackbody infrared emissivity measurement by integrating sphere reflectometer at room temperature environment at wavelength of 0.633 μm. Measurement results on multiple wavelengths show that the deviation between the integrated blackbody infrared emissivity simulation results and the measurement results is less than 0.3 %.

Paper Details

Date Published: 18 December 2019
PDF: 8 pages
Proc. SPIE 11337, AOPC 2019: Optical Spectroscopy and Imaging, 1133707 (18 December 2019); doi: 10.1117/12.2541506
Show Author Affiliations
Xu-yao Song, Changchun Univ. of Science and Technology (China)
Qing-duo Duanmu, Changchun Univ. of Science and Technology (China)
Wei Dong, National Institute of Metrology (China)
Chun-teng Shao, Changchun Univ. of Science and Technology (China)
Zhi-bin Li, Changchun Univ. of Science and Technology (China)
Yi-jie Pan, National Institute of Metrology (China)
Zun-dong Yuan, National Institute of Metrology (China)
Jing-hui Wang, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 11337:
AOPC 2019: Optical Spectroscopy and Imaging
Jin Yu; Zhe Wang; Vincenzo Palleschi; Mengxia Xie; Yuegang Fu, Editor(s)

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