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One-shot optical sectioning structured illumination microscopy
Author(s): Hongting Wang; Wenli Liu; Zhixiong Hu; Xiuyu Li; Baoyu Hong
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Paper Abstract

We propose fast, economical one-shot optical sectioning structured illumination microscopy (OSSIM) based on the sectioning structured illumination wide-field fluorescence microscopy (SSIWM). Unlike using three precise known phase patterns in conventional three-step SSIWM, every section of the specimen is modulated using a one-dimensional sinusoidal pattern with an arbitrary phase in the proposed method. There are few steps to get the section image from the modulated image. A fringe-free spectrum is obtained using a filter in the Fourier domain, and the reconstructed section is recovered from its inverse Fourier transform and the modulus calculation. In the conventional SSIWM, the accurate positioning is demanded to match the three phases perfectly to avoid artificial fringe on the reconstructed image. Compared with three-step SSIWM, OSSIM shows reduced illumination and observation time, specimen damage, and it avoids reconstruction artefacts resulting from inaccurate phase-shift. Furthermore, OSSIM can directly utilize images captured using SSIWM without modifying the setup. The proposed method is supported by a series of derivations and is validated through simulations and experiments.

Paper Details

Date Published: 18 December 2019
PDF: 7 pages
Proc. SPIE 11338, AOPC 2019: Optical Sensing and Imaging Technology, 113380F (18 December 2019); doi: 10.1117/12.2541477
Show Author Affiliations
Hongting Wang, National Institute of Metrology (China)
Wenli Liu, National Institute of Metrology (China)
Zhixiong Hu, National Institute of Metrology (China)
Xiuyu Li, National Institute of Metrology (China)
Baoyu Hong, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 11338:
AOPC 2019: Optical Sensing and Imaging Technology
John E. Greivenkamp; Jun Tanida; Yadong Jiang; HaiMei Gong; Jin Lu; Dong Liu, Editor(s)

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