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Measurement and analysis of the absorptance of cryogenic radiometer cavity
Author(s): Hongbo Liu; Xueshun Shi M.D.; Xingang Zhuang; Pengju Zhang M.D.; Changming Liu; Hengfei Wang; Hongyuan Liu M.D.
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Paper Abstract

Cryogenic radiometer is considered as the international benchmark for optical power measurement, which requires the core light radiation receiving device (cavity) has high absorption coefficient over 0.9999 at presented. In this paper, we have developed a new cavity are made of oxygen-free high-conductivity copper (OFHC) cylinder and coated with nickel-phosphorus (NiP) black paint. The cavity absorptance has been experimentally evaluated at different black paints and different structures. The result shows that the inclined bottom cylindrical cavity blackened with nickel-phosphorus black paint achieves an absorptance up to 0.9999964±0.000005; The most significant improvements in uncertainty arise from the enhanced characteristics of the cryogenic radiometer including its higher cavity absorptance and reduced non-equivalence effects.

Paper Details

Date Published: 18 December 2019
PDF: 6 pages
Proc. SPIE 11338, AOPC 2019: Optical Sensing and Imaging Technology, 113380E (18 December 2019); doi: 10.1117/12.2541416
Show Author Affiliations
Hongbo Liu, The 41st Research Institute of China Electronics Technology Group Corp. (China)
National Opto-Electronic Primary Metrology Lab. (China)
Xueshun Shi M.D., The 41st Research Institute of China Electronics Technology Group Corp. (China)
National Opto-Electronic Primary Metrology Lab. (China)
Xingang Zhuang, The 41st Research Institute of China Electronics Technology Group Corp. (China)
National Opto-Electronic Primary Metrology Lab. (China)
Pengju Zhang M.D., The 41st Research Institute of China Electronics Technology Group Corp. (China)
National Opto-Electronic Primary Metrology Lab. (China)
Changming Liu, The 41st Research Institute of China Electronics Technology Group Corp. (China)
National Opto-Electronic Primary Metrology Lab. (China)
Hengfei Wang, The 41st Research Institute of China Electronics Technology Group Corp. (China)
National Opto-Electronic Primary Metrology Lab. (China)
Hongyuan Liu M.D., The 41st Research Institute of China Electronics Technology Group Corp. (China)
National Opto-Electronic Primary Metrology Lab. (China)


Published in SPIE Proceedings Vol. 11338:
AOPC 2019: Optical Sensing and Imaging Technology
John E. Greivenkamp; Jun Tanida; Yadong Jiang; HaiMei Gong; Jin Lu; Dong Liu, Editor(s)

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