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Proceedings Paper

Research on the response calibration technology of ultraviolet focal plane array devices
Author(s): HongYuan Liu; ChengPing Ying; Hongchao Wang; Bin Wu; Guochao Li; Yanzhao Yang
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Paper Abstract

Responsivity is one of the important technical parameters of the detector. With the development of ultraviolet detector technology, ultraviolet focal plane array devices have also been rapidly developed. Therefore, it is increasingly important to accurately measure the response of ultraviolet detectors. This paper analyzes the principle of UV focal plane array response measurement, uses the alternative method to measure the response of the UV focal plane array detection device, and establishes the UV focal plane array response measurement device. The results of uncertainty analysis show that the uncertainty of the UV focal plane array device response measurement system is about 4.2 %, can meet the measurement requirements.

Paper Details

Date Published: 18 December 2019
PDF: 5 pages
Proc. SPIE 11338, AOPC 2019: Optical Sensing and Imaging Technology, 113380D (18 December 2019); doi: 10.1117/12.2541415
Show Author Affiliations
HongYuan Liu, The 41st Research Institute of China Electronics Technology Group Corp. (China)
ChengPing Ying, The 41st Research Institute of China Electronics Technology Group Corp. (China)
Science and Technology on Electronic Test & Measurement Lab. (China)
Hongchao Wang, The 41st Research Institute of China Electronics Technology Group Corp. (China)
Bin Wu, The 41st Research Institute of China Electronics Technology Group Corp. (China)
Science and Technology on Electronic Test & Measurement Lab. (China)
Guochao Li, The 41st Research Institute of China Electronics Technology Group Corp. (China)
Yanzhao Yang, The 41st Research Institute of China Electronics Technology Group Corp. (China)


Published in SPIE Proceedings Vol. 11338:
AOPC 2019: Optical Sensing and Imaging Technology
John E. Greivenkamp; Jun Tanida; Yadong Jiang; HaiMei Gong; Jin Lu; Dong Liu, Editor(s)

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