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Proceedings Paper

Research on high frame rate scene projection method based on digital micromirror device (DMD)
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Paper Abstract

The digital micromirror device DMD is widely used in visible light projection, special-purpose spatial light modulation, and infrared scene simulation, due to its high resolution, uniformity and energy concentration. In some applications that require high frame rate scene image display, it is necessary to ensure that the DMD displays high gray level images at a high frame rate. However, the display frame rate of the pulse width modulation (PWM) method is limited by the minimum time required for DMD loading data, unable to achieve high frame rate display. Although the DMD binary display mode can meet the requirements of high frame rate display, it cannot meet the requirements of high gray level. The paper proposes an image display method that uses light source and DMD to synchronize modulation. Decompose the high-order gray image into bit planes according to the gray threshold, and the DMD displays each bit plane in binary mode under the trigger of an sync pulse. The intensity of the illumination laser source is modulated by an acousto-optic modulator to match the bit plane and the radiated laser power. This method makes use of the function of high frame rate display in DMD binary mode cooperate with light intensity modulation of illumination laser source, and realizes high frame rate and high dynamic range image display. With this method, the maximum frame rate of 8-bit gray level image with 1920 ×1080 resolution can reach 2KHz. The experimental system has realized 200Hz frame rate display of 8-bit gray level image with 1920 ×1080 resolution.

Paper Details

Date Published: 12 March 2020
PDF: 9 pages
Proc. SPIE 11438, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, 1143806 (12 March 2020); doi: 10.1117/12.2540963
Show Author Affiliations
Jian Song, Beijing Institute of Technology (China)
Yanze Gao, Beijing Institute of Technology (China)
Zhuo Li, Beijing Institute of Technology (China)
Jitian Li, Beijing Institute of Technology (China)
Xiaole Zhang, Beijing Institute of Technology (China)
Lang Zhou, Beijing Institute of Technology (China)
Qingfeng Shi, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 11438:
2019 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology
Guohai Situ; Xun Cao; Wolfgang Osten, Editor(s)

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