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Proceedings Paper

Bulk damage monitor on MPTB
Author(s): Andrew D. Holland; Nick Nelms; Ali Mohammadzadeh; Stephen J. Watts; Andrew Holmes-Siedle; Peter J. Pool
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Paper Abstract

The microelectronics and photonics test bed (MPTB) operated by NRL is intended to provide an experimental platform for the evaluation of the effects of radiation damage on advanced microelectronic circuits and photonic devices. While several systems exist to monitor the accumulation of dose from ionizing radiation in space, little attention has been given to the accumulation of bulk damage in semiconductors. This is of increasing concern when using sensitive detectors for example for astronomical imaging or star-sensing. The bulk damage monitor experiment is designed as a prototype module to monitor the accumulation of bulk damage and uses a sensitive linear charge coupled device in a system designed to accurately monitor the effect of non- ionizing radiation. The experiment, which is light weight, with very low average power consumption and telemetry volume, may form one element in future dosimetry systems on- board spacecraft.

Paper Details

Date Published: 18 October 1996
PDF: 6 pages
Proc. SPIE 2811, Photonics for Space Environments IV, (18 October 1996); doi: 10.1117/12.254049
Show Author Affiliations
Andrew D. Holland, Univ. of Leicester (United Kingdom)
Nick Nelms, Univ. of Leicester (United Kingdom)
Ali Mohammadzadeh, Brunel Univ. (United Kingdom)
Stephen J. Watts, Brunel Univ. (United Kingdom)
Andrew Holmes-Siedle, Brunel Univ. (United Kingdom)
Peter J. Pool, English Electric Valve Ltd. (United Kingdom)

Published in SPIE Proceedings Vol. 2811:
Photonics for Space Environments IV
Edward W. Taylor, Editor(s)

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