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Proceedings Paper

Optical metrology for the morphological characterization of surfaces: limitations, innovations, registration and new directions
Author(s): J. W. McBride; K. J. Cross; T. G. Bull
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Paper Abstract

An overview is provided of the non-contact measurement of surface morphology, focusing on form and roughness. Existing methods considered include con-focal scanning methods for the evaluation of large-scale surfaces where comparisons are drawn with direct areal measurements where data stitching is required to provide coverage of large scale surfaces. The applications of large-scale surfaces presented include, free form dental metrology, paleontology and early cylindrical mechanical sound recordings. Data registration of free form surfaces is presented to determine low scale wear of dental surfaces. For the new directions, consideration is given to the application of precision X-ray computer tomography, to determine free form surfaces and applied to the dental surfaces. The results show that the con-focal method remains the best solution for complex free form surfaces and that the XCT systems while offering some advantages require further research for full application.

Paper Details

Date Published: 18 November 2019
PDF: 8 pages
Proc. SPIE 11189, Optical Metrology and Inspection for Industrial Applications VI, 111890S (18 November 2019); doi: 10.1117/12.2540438
Show Author Affiliations
J. W. McBride, Univ. of Southampton (United Kingdom)
K. J. Cross, TaiCaan Technologies Ltd. (United Kingdom)
T. G. Bull, TaiCaan Technologies Ltd. (United Kingdom)

Published in SPIE Proceedings Vol. 11189:
Optical Metrology and Inspection for Industrial Applications VI
Sen Han; Toru Yoshizawa; Song Zhang; Benyong Chen, Editor(s)

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