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Proceedings Paper

How can a plenoptic camera be used as a metrology tool?
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Paper Abstract

In this paper, we propose a method for the structured-light field (SLF) 3D measurement, involving ray calibration and phase mapping. The ray calibration is carried out to determine each light ray with metric spatio-angular parameters. Base on the ray parametric equation, the phase mapping in the SLF is developed so that spatial coordinates could be directly mapped from phase-encoding information. Then, a calibration strategy is designed to determine the mapping coefficients for each light ray, achieving high-efficiency SLF 3D reconstruction.

Paper Details

Date Published: 18 November 2019
PDF: 7 pages
Proc. SPIE 11189, Optical Metrology and Inspection for Industrial Applications VI, 1118902 (18 November 2019); doi: 10.1117/12.2540184
Show Author Affiliations
Zewei Cai, Shenzhen Univ. (China)
Xiaoli Liu, Shenzhen Univ. (China)
Giancarlo Pedrini, Univ. Stuttgart (Germany)
Wolfgang Osten, Univ. Stuttgart (Germany)
Xiang Peng, Shenzhen Univ. (China)

Published in SPIE Proceedings Vol. 11189:
Optical Metrology and Inspection for Industrial Applications VI
Sen Han; Toru Yoshizawa; Song Zhang; Benyong Chen, Editor(s)

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